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SEMS / MICROSCOPES
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Zeiss Supra SEM

CAC Name: supra

Scanning Electron Microscope

Zeiss Supra 55VP Backup: John Treichler , Amrita Banerjee
Equipment Training
Please sign up online at least one day in advance on the CNF users face to face training page http://www2.cnfusers.cornell.edu/facetoface.php , then sign up for Zeiss Ultra SEM training. Training for the Zeiss Ultra SEM also includes training on the Zeiss Supra SEM.

Description:

This SEM has resolution of 1.0 nm at 15 kV, and 1.7 nm at 1 kV at high vacuum mode (HV); 2nm at 30kV at variable pressure mode (VP). 100V to 30kV represents the wide range of the accelerating voltage used on the machine with capability of imaging insulating samples at the lower end of the spectrum. Electromagnetic beam and aperature alignment enables rapid changing between the six beam defining apertures. The GEMINI column employs a Schottky field emittor electron source using a single condenser with a crossover-free beam path. The machine is equiped with a Everhardt Thornley secondary electron (SE) detector, a variable pressure secondary electron (VPSE) detector for use at variable pressure mode with real time automatic contrast/brightness and manual override, a backscatter detector as well as a through the lens SE detector.

Capabilities:

  • 1.7nm resolution at 1kV
  • 1nm resolution at 15kV
  • Variable pressure mode for non-conducting materials
  • Low energy ebeam lithography with the connected Nabity system


Additional Resources:

Equipment Information Sheet
CNF SEM basics
JEOL guide to SEM
Location of tool in cleanroom (jpg)

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