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METROLOGY
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CDE ResMap Resistivity 4-pt Probe

CAC Name: CDE

Automatic 4 point probe resitivity mapper

CDE Resitivity Mapper
Manager: Phil Infante
Backup: Aaron Windsor
Equipment Training
Please contact the tool manager to schedule a training session.

Description:

The CDE resistivity mapper is a 4 point probe system with an automatic stage. It can be used to measure the surface resistivity of thin films or with calibration, the thickness and uniformity of conductive thin films.


Additional Resources:

Equipment Information Sheet


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