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Lithography

    Thin Film Deposition, Synthesis and Processing

    Characterization

    Process Integration

    Modeling and Simulation



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    This material is based upon work supported by the National Science Foundation under Grant No. 0649215. Any opinions, findings, conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.

    Cornell NanoScale Science & Technology Facility (CNF)
    250 Duffield Hall, Cornell University, Ithaca, New York 14853-2700
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