PANalytical X'Pert Pro MRD X-ray Diffraction System

For training, please contact the Tool Manager(s).


PANalytical X'Pert Pro MRD is a diffractometer for thin films, both single crystals and polycrystalline. High-resolution analysis capability is improved by the outstanding accuracy of a high-resolution goniometer using Heidenhain encoders. 


X-rays were generated from a Cu anode supplied with 40 kV and a current of 40 mA. High resolution x-ray diffraction is generally applied to highly ordered crystals.  It is useful to examine nearly lattice matched materials or the structural perfection of materials. 

Processes Available
  • Sample holder accommodates samples up to 4 inches in diameter.
  • Triple axis setup utilizes a three bounce (022) channel cut Ge crystal to provide an acceptance angle of 12 arc seconds.
  • Rocking curve optics utilize interchangeable slits to control the background and detector resolution.