ABM Contact Aligner
Additional Restrictions
- 4" - 9" masks, up to 200mm wafers, up to 0.25" thick
- Back of substrate must be CLEAN - NO RESIST on back
Return to list of compatibility categories
Allowed | Not Allowed |
---|---|
Tool category 1/1E, 2, 3, and 4 materials | |
Silicon Based Substrates and Films | |
III/V compound Semiconductors | |
Glass Substrates | |
PECVD and ALD Films | |
Cured organics and baked Photoresist | |
CNF Class A, B, and Refractory metals | |
Exposed Gold, Silver, Copper | |
Alkali and Alkaline Compounds | |
Organic/Biology Molecules prepared-w/salt buffers | |
High Vapor Pressure Materials (Mg, Ca, Zn)* | * Some tool restrictions on high vapor pressure materials may apply |
Soft organic materials |
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Please review electron beam lithography training materials, in AFS, at shares - public - processes_from_cnf_staff - ElectronBeamLithography - TrainingMaterials (accessible on any general use PC or CNF Thin client at CNF)
None.
Some tool restrictions on high vapor pressure materials may apply.