Complete CULearn course:

Additional Restrictions
  • Samples must be clean
  • Resist must be fully cured

The DektakXT is a stylus profilometer with 4 A repeatability. The tool is loaded with a 2um radius of curvature diamond-tipped stylus. We have sample stages to accommodate wafer pieces, as well as full size wafers up to 200mm. The software gives us motorized stage translation and rotation, as well as sequencing for up to 200 sites. The Vision64 software can also use the tool measurements to create a 3D map of the scanned surface.

This profilometer is meant for those with advanced profilometry needs.