Advanced optical waveguiding measurements

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Additional Restrictions

    The Metricon Model 2010/M Prism Coupler utilizes advanced optical waveguiding techniques to rapidly and accurately measure both the thickness and the refractive index/birefringence of dielectric and polymer films as well as refractive index of bulk materials. The 2010/M offers unique advantages over conventional refractometers and instruments based on ellipsometry or spectrophotometry:

    • Completely general - no advanced knowledge of optical properties of film/substrate required
    • No advanced knowledge of optical properties of film/substrate required.
    • Routine index accuracy of ± 0.0005 (accuracy of up to ± 0.0001 available for many applications).
    • Routine index resolution of ± 0.0003 (resolution of up to ± 0.00005 available for many applications).
    • High accuracy index measurement of film or substrate.
    • Simple measurement of index vs. wavelength.
    • Can measure waveguide loss of a blanket film.
    • Wide index measurement range (1.0 - 2.4).