Allowed | Not Allowed |
---|---|
Tool category 1/1E and 2 materials | Glass Substrates |
III/V compound Semiconductors allowed | No CNF Class A or Class B metals-and oxides/compounds of i.e. (Magnesium,Zinc, Barium, Calcium) |
PECVD and ALD Films | No High Vapor pressure materials |
Cured organics and baked Photoresist | |
Organic/Bio Materials prepped w/o Salt Buffers |
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Category 3 LPCVD LTO410 - A3
Additional Restrictions
- Category 3 MOS CLEAN required prior to use
Category 3 MOS Clean Bench & Tanks
Additional Restrictions
Category 3 Polysilicon - A4
Additional Restrictions
- Category 3 MOS CLEAN required prior to use
Oxford 81 Etcher
Additional Restrictions
- No gold or silver etching
- No high vapor pressure materials (lead, indium, ITO)
- No microscope slides
- Do not exceed maximum RF power of 300W
- Do not clean chamber with wipes or solvent. Report contamination to tool manager
Plasma-Therm Takachi HDP-CVD
Additional Restrictions
- If any polymer is present on wafer, 5mm of the edge must be removed
- Polymers must be fully cured at least 25C hotter than the deposition temperature
- No metals should be exposed to the plasma without staff approval
PT770 Etcher - Left Side (Metal Etch)
Additional Restrictions
- 4-inch wafers only.
- Photoresist mask - edge bead must be removed (5mm ring) if using 4-inch wafers
- Pieces should be mounted to sapphire wafer
- Do not change recipes without staff approval
PT770 Etcher - Right Side (III-V)
Additional Restrictions
- Photoresist, oxide, nitride, nickel masking only
- Photoresist mask - edge bead must be removed (5mm ring) if using 100mm wafers
- Limited metal masking allowed - see tool manager