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Phil Infante
Title
PECVD, MOS, Safety
Email - Directory
infante@cnf.cornell.edu
Office Phone
607-254-4926
Manager for:
A1 - General Material Anneal 1
A2 - POCL3 Doping
A3 - Category 3 LPCVD Silicon Nitride
A4 - LPCVD Silicon Carbide
B1 - Category 1 MOS Clean Anneal 2
B2 - Wet/Dry Oxide
B3 - LPCVD LTO
B4 - LPCVD Silicon Nitride
C1- MOS Metal Anneal 3
C2 - MOS Metal Anneal 4
C3- LPCVD TEOS
C4 - N+/P+ Polysilicon
D1 - Solid Source Boron Doping
D2 - Solid Source Phosphorus Doping
D3 - CMOS N+ Polysilicon
D4 - CMOS P+ Polysilicon
E1 - CMOS Gate Oxide
E2 - CMOS Wet Oxide
E3 - CMOS Undoped Poly
E4 - LPCVD CMOS Nitride
Everbeing 4-Point Probe
Everbeing EB-6 DC Probe Station
Filmetrics RS50
Hot Phosphoric Tank
Keithley 4200A - IVCV Testing Station
MOS Clean Bench & Tanks
MOS Clean Bench & Tanks - Category 3 Materials
Nanostrip Tank
Seki Diamond CVD
Soft Materials 4-pt Probe Station (2nd floor)
Backup for:
Oxford PECVD
Primaxx Vapor HF Etcher
PVD 75 Sputter Deposition
RTA - AG610a
RTA - AG610b
Spin Rinse Dryers
Wet Scrubber

Please acknowledge the CNF in your presentations, posters, and publications.

This material is based upon work supported by the National Science Foundation under Grant No. NNCI-2025233. Any opinions, findings, conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.

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